Sfoglia per Rivista MEASUREMENT SCIENCE
The MeteoMet2 project—highlights and results
2018 Merlone, A; Sanna, F; Beges, G; Bell, S; Beltramino, G; Bojkovski, J; Brunet, M; del Campo, D; Castrillo, A; Chiodo, N; Colli, M; Coppa, Graziano; Cuccaro, R; Dobre, M; Drnovsek, J; Ebert, V; Fernicola, V; Garcia-Benadí, A; Garcia-Izquierdo, C; Gardiner, T; Georgin, E; Gonzalez, A; Groselj, D; Heinonen, M; Hernandez, S; Högström, R; Hudoklin, D; Kalemci, M; Kowal, A; Lanza, L; Miao, P; Musacchio, C; Nielsen, J; Nogueras-Cervera, M; Oguz Aytekin, S; Pavlasek, P; de Podesta, M; Rasmussen, M K; del-Río-Fernández, J; Rosso, L; Sairanen, H; Salminen, J; Sestan, D; Šindelářová, L; Smorgon, D; Sparasci, F; Strnad, R; Underwood, R; Uytun, A; Voldan, M
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor
2011 Picotto, Gianbartolo
A method to deal with correlations affecting γ counting efficiencies in analytical chemistry measurements performed by k 0-NAA
2020 DI LUZIO, Marco; D'Agostino, Giancarlo; Oddone, Massimo
The metrology of electrical impedance at high frequency: a review
2009 Callegaro, Luca
A microwave resonance dew-point hygrometer
2012 Underwood, R. J.; Cuccaro, R.; Bell, S.; Gavioso, Roberto; MADONNA RIPA, DANIELE ANGELO; Stevens, M.; de Podesta, M.
A multi-electrode plane capacitive sensor for displacement measurements and attitude controls
2009 Picotto, Gianbartolo; Pisani, Marco; Sosso, Andrea
Nanoscale metrology
2009 Picotto, Gianbartolo; Koenders, L.; Wilkening, G.
New European Metrology Network for advanced manufacturing
2021 Przyklenk, Anita; Balsamo, Alessandro; O’Connor, Daniel; Evans, Alexander; Yandayan, Tanfer; Akgöz, Sibel Asli; Flys, Olena; Phillips, Dishi; Zeleny, Vit; Czułek, Dariusz; Meli, Felix; Ragusa, Carlo Stefano; Bosse, Harald
The new INRIM rotating encoder angle comparator (REAC)
2017 Pisani, Marco; Astrua, Milena
On the effect of broadband emission in external-cavity diode-laser interferometry
2007 Galzerano, G; Mana, Giovanni; Massa, Enrico
Optical Linking of Reference Channel
1999 Callegaro, L; Cassiago, Cristina; D'Elia, V.
Optical linking of reference channel for lock-in amplifiers
1999 Callegaro, Luca; Cassiago, Cristina; D'Elia, V.
Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals
1999 Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, Enrico; Zosi, G.
Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals (vol 10, pg 549, 1999)
1999 Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, E; Zosi, G.
Prism refractive index measurement at INRiM
2009 Astrua, Milena; Pisani, Marco
Propagation of error analysis in least-squares procedures with second-order autoregressive measurement errors
2002 Durando, Giovanni; Mana, Giovanni
Properties of nickel thin films on polyimide substrata for HF bolometers
1993 Brunetti, Luciano; Monticone, Eugenio
Quadrature phase shifter for audio frequency sinewaves
1997 Callegaro, Luca; D'Elia, V.
Radiation temperature scales between the indium and silver points realized at IMGC, NPL and UME using a fixed-point calibration technique
2002 Ricolfi, T; Battuello, Mauro; Girard, Ferruccio; Machin, G; Mcevoy, H; Ugur, S; Diril, A.
Reference measurement system for low electrolytic conductivity values with a flowing solution
2013 Orru, E; Durbiano, Francesca; Ortolano, M.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| The MeteoMet2 project—highlights and results / Merlone, A; Sanna, F; Beges, G; Bell, S; Beltramino, G; Bojkovski, J; Brunet, M; del Campo, D; Castrillo, A; Chiodo, N; Colli, M; Coppa, Graziano; Cuccaro, R; Dobre, M; Drnovsek, J; Ebert, V; Fernicola, V; Garcia-Benadí, A; Garcia-Izquierdo, C; Gardiner, T; Georgin, E; Gonzalez, A; Groselj, D; Heinonen, M; Hernandez, S; Högström, R; Hudoklin, D; Kalemci, M; Kowal, A; Lanza, L; Miao, P; Musacchio, C; Nielsen, J; Nogueras-Cervera, M; Oguz Aytekin, S; Pavlasek, P; de Podesta, M; Rasmussen, M K; del-Río-Fernández, J; Rosso, L; Sairanen, H; Salminen, J; Sestan, D; Šindelářová, L; Smorgon, D; Sparasci, F; Strnad, R; Underwood, R; Uytun, A; Voldan, M. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 29:2(2018), p. 025802. [10.1088/1361-6501/aa99fc] | 2018 | Merlone, ABeltramino, GCOPPA, GRAZIANOCuccaro, RFernicola, VMusacchio, CRosso, LSmorgon, D + | Merlone_2018_Meas._Sci._Technol._29_025802.pdf; MeteoMet2 version 3_preprint.pdf |
| A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor / Picotto, Gianbartolo. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 22:(2011), pp. 094027-094033. [10.1088/0957-0233/22/9/094027] | 2011 | PICOTTO, GIANBARTOLO | - |
| A method to deal with correlations affecting γ counting efficiencies in analytical chemistry measurements performed by k 0-NAA / DI LUZIO, Marco; D'Agostino, Giancarlo; Oddone, Massimo. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 31:7(2020), p. 074006. [10.1088/1361-6501/ab7ca8] | 2020 | Marco Di LuzioGiancarlo D’Agostino + | Di_Luzio_2020_Meas._Sci._Technol._31_074006.pdf; diluzio_et_al_rev.pdf |
| The metrology of electrical impedance at high frequency: a review / Callegaro, Luca. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 20:(2009), pp. 022002:1-022002:14. [10.1088/0957-0233/20/2/022002] | 2009 | CALLEGARO, LUCA | - |
| A microwave resonance dew-point hygrometer / Underwood, R. J.; Cuccaro, R.; Bell, S.; Gavioso, Roberto; MADONNA RIPA, DANIELE ANGELO; Stevens, M.; de Podesta, M.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 23:8(2012), pp. 085905-1-085905-9. [10.1088/0957-0233/23/8/085905] | 2012 | Cuccaro, R.GAVIOSO, ROBERTOMADONNA RIPA, DANIELE ANGELO + | - |
| A multi-electrode plane capacitive sensor for displacement measurements and attitude controls / Picotto, Gianbartolo; Pisani, Marco; Sosso, Andrea. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 20:8(2009), pp. 084011-084014. [10.1088/0957-0233/20/8/084011] | 2009 | PICOTTO, GIANBARTOLOPISANI, MARCOSOSSO, ANDREA | - |
| Nanoscale metrology / Picotto, Gianbartolo; Koenders, L.; Wilkening, G.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 20:8(2009), pp. 080101-080102. [10.1088/0957-0233/20/8/080101] | 2009 | PICOTTO, GIANBARTOLO + | - |
| New European Metrology Network for advanced manufacturing / Przyklenk, Anita; Balsamo, Alessandro; O’Connor, Daniel; Evans, Alexander; Yandayan, Tanfer; Akgöz, Sibel Asli; Flys, Olena; Phillips, Dishi; Zeleny, Vit; Czułek, Dariusz; Meli, Felix; Ragusa, Carlo Stefano; Bosse, Harald. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 32:11(2021), p. 111001. [10.1088/1361-6501/ac0d25] | 2021 | Balsamo, Alessandro + | 2021-07-21 MST - AdvManuNet.pdf |
| The new INRIM rotating encoder angle comparator (REAC) / Pisani, Marco; Astrua, Milena. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 28:4(2017), p. 045008. [10.1088/1361-6501/aa5af6] | 2017 | PISANI, MARCOASTRUA, MILENA | pisani astrua manuscript 14 oct 2016.pdf; REAC_2017_Meas._Sci._Technol.pdf |
| On the effect of broadband emission in external-cavity diode-laser interferometry / Galzerano, G; Mana, Giovanni; Massa, Enrico. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 18:(2007), pp. 1338-1342. | 2007 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Optical Linking of Reference Channel / Callegaro, L; Cassiago, Cristina; D'Elia, V.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 10:(1999), pp. N91-N92. [10.1088/0957-0233/10/7/404] | 1999 | CALLEGARO LCASSIAGO, CRISTINA + | - |
| Optical linking of reference channel for lock-in amplifiers / Callegaro, Luca; Cassiago, Cristina; D'Elia, V.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 10:(1999), pp. N91-N92. | 1999 | CALLEGARO, LUCACASSIAGO, CRISTINA + | - |
| Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals / Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, Enrico; Zosi, G.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 10:6(1999), pp. 549-553. [10.1088/0957-0233/10/6/321] | 1999 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals (vol 10, pg 549, 1999) / Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, E; Zosi, G.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 10:12(1999), pp. 1353-1353. [10.1088/0957-0233/10/12/334] | 1999 | MANA, GIOVANNI + | - |
| Prism refractive index measurement at INRiM / Astrua, Milena; Pisani, Marco. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 20:(2009), pp. 095305-095311. | 2009 | ASTRUA, MILENAPISANI, MARCO | - |
| Propagation of error analysis in least-squares procedures with second-order autoregressive measurement errors / Durando, Giovanni; Mana, Giovanni. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 13:10(2002), pp. 1505-1511. [10.1088/0957-0233/13/10/301] | 2002 | DURANDO, GIOVANNIMANA, GIOVANNI | - |
| Properties of nickel thin films on polyimide substrata for HF bolometers / Brunetti, Luciano; Monticone, Eugenio. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 4:11(1993), pp. 1244-1248. [10.1088/0957-0233/4/11/011] | 1993 | BRUNETTI, LUCIANOMONTICONE, EUGENIO | - |
| Quadrature phase shifter for audio frequency sinewaves / Callegaro, Luca; D'Elia, V.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 8:(1997), pp. 673-675. | 1997 | CALLEGARO, LUCA + | - |
| Radiation temperature scales between the indium and silver points realized at IMGC, NPL and UME using a fixed-point calibration technique / Ricolfi, T; Battuello, Mauro; Girard, Ferruccio; Machin, G; Mcevoy, H; Ugur, S; Diril, A.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 13:(2002), pp. 2090-2093. [10.1088/0957-0233/13/12/338] | 2002 | BATTUELLO, MAUROGIRARD, FERRUCCIO + | - |
| Reference measurement system for low electrolytic conductivity values with a flowing solution / Orru, E; Durbiano, Francesca; Ortolano, M.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 24:3(2013), p. 035903.035903. [10.1088/0957-0233/24/3/035903] | 2013 | DURBIANO, FRANCESCA + | - |
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